Key facts
- University of Idaho scientists identified a genetic mutation in wheat associated with increased yield.
- The mutation is a nucleotide deletion, linked to later flowering and more spikelets.
- This genetic change is associated with a 5% to 10% yield increase.
- Researchers developed molecular markers to screen wheat lines for this mutation.
- A faster and less expensive screening method using 4,000 SNPs was validated.
University of Idaho scientists, led by wheat breeder Jianli Chen, have identified a naturally occurring genetic mutation in wheat that is associated with a 5% to 10% increase in yield. The mutation, a nucleotide deletion where a small piece of DNA is missing, has been linked to later plant flowering and an increase in spikelets, which are the clusters of flowers that develop into grain.
Researchers confirmed the presence of this mutation in several high-yielding wheat lines, including the hard white spring variety UI Gold, released in 2022, and other experimental lines. Chen stated that the development of molecular markers for this gene mutation will allow for easier screening by breeding programs.
The research, funded by a five-year, $15 million grant from the USDA's National Institute of Food and Agriculture, involved collaboration with 22 institutions, led by the University of California, Davis. Chen's program received $537,644 in spending authority and built upon previous grant work.
Chen's team also validated a faster and more cost-effective method for screening wheat lines for yield and associated traits. This new approach uses a platform of 4,000 single nucleotide polymorphisms (SNPs), proving as effective as the traditional method using 90,000 SNPs, and saving approximately $60 per sample in testing costs. Chen plans to apply this streamlined platform to test for other traits like drought tolerance and baking quality.